카테고리
전체 > 전체

Anomalous Stress-Induced Hump Effects in Amorphous Indium Gallium Zinc Oxide TFTs

소개글 Author: Kim Yu-Mi, Jeong Kwang-Seok, Yun Ho-Jin, Lee Ga-Won, Lee Sang-Youl, Lee Hi-Deok, Yang Seung-Dong Organization: Kim Yu-Mi; Jeong Kwang-Seok; Yun Ho-Jin; Lee Ga-Won; Lee Sang-Youl; Lee Hi-Deok; Yang Seung-Dong Publish: Transactions on Electrical and Electronic Materials Volume 13, Issue1, p47~49, 25 Feb 2012
태그
  • IGZO
  • Anomalous hump
  • Bias stress
  • NBS
  • PBS
  • Thin film transistor (TFT)