카테고리
전체 > 전체

Effects of Composition on the Memory Characteristics of (HfO2)x(Al2O3)1-x Based Charge Trap Nonvolatile Memory

소개글 ##Author: Tang Zhenjie, Dongwei Ma, Jing Zhang, Yunhong Jiang, Guixia Wang, Dongqiu Zhao, Li Rong, Yin Jiang ##Organization: Tang Zhenjie; Dongwei Ma; Jing Zhang; Yunhong Jiang; Guixia Wang; Dongqiu Zhao; Li Rong; Yin Jiang ##Publish: Transactions on Electrical and Electronic Materials Volume 15, Issue5, p241~244, 25 Oct 2014
태그
  • Composition
  • Memory capacitors
  • Charge trap
  • Atomic layer deposition